DocumentCode :
1350687
Title :
GaAsSb-based backward diodes for highly sensitive millimetre-wave detectors
Author :
Takahashi, Tatsuro ; Sato, Mitsuhisa ; Hirose, Tatsuya ; Hara, Naoya
Author_Institution :
Fujitsu Ltd., Kawasaki, Japan
Volume :
45
Issue :
24
fYear :
2009
Firstpage :
1269
Lastpage :
1270
Abstract :
Highly sensitive millimetre-wave detectors based on p-GaAs0.51Sb0.49/i-In0.52Al0.48As/n-InxGa1-xAs backward diodes under zero-bias operation were developed on an InP substrate. Voltage sensitivity of 12300 V/W at 94 GHz was achieved with the GaAsSb-based diode which has a circular mesa with a diameter of 0.9 m. To improve the sensitivity, the indium composition of the n-InxGa1-xAs layer and thickness of the i-In0.52Al0.48As layer were optimised. Furthermore, a self-aligned process was performed to minimise parasitic resistance at an ohmic contact layer. These GaAsSb-based diodes that are lattice-matched to InP are promising for easy integration with high-performance InP low-noise amplifiers.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; low noise amplifiers; millimetre wave detectors; millimetre wave diodes; ohmic contacts; p-i-n diodes; wide band gap semiconductors; GaAs0.51-Sb0.49-In0.52Al0.48As-InxGa1-xAs; InP; backward diode; frequency 94 GHz; highly-sensitive millimetre-wave detector; low-noise amplifier; ohmic contact layer; parasitic resistance; self-aligned process; size 9 m; zero-bias operation;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2009.2496
Filename :
5349313
Link To Document :
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