• DocumentCode
    1350836
  • Title

    Experimental study of the current redistribution in pulsed operation inside the Nb/sub 3/Sn CICC of an ITER relevant magnet

  • Author

    Balsamo, E.P. ; Gislon, P. ; Pasotti, G. ; Ricci, M.V. ; Spadoni, M. ; Minervini, J.V. ; Vysotsky, V.S.

  • Author_Institution
    Associazione EURATOM-ENEA, Frascati, Italy
  • Volume
    10
  • Issue
    2
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    1598
  • Lastpage
    1602
  • Abstract
    It is believed that critical current reduction in multistrand superconducting cables at nonsteady state conditions is caused by a nonuniform current distribution among strands. This was experimentally proven for small model cables, but is still not verified for large cables. In the ENEA Frascati Laboratory, an ITER relevant, large superconducting magnet has been tested at different field ramp rates. By means of numerous local miniature field sensors (Hall probes and pickup coils) located in a few positions along the conductor, current redistribution phenomena inside the cable have been studied. Fast and slow local field changes have been studied to quantify the current nonuniformity. It has been shown that severe current nonuniformity does exist in the cable and that induced current loops are generated, which decay with very long time constants (up to 10/sup 4/-10/sup 5/ s).
  • Keywords
    current distribution; niobium alloys; superconducting magnets; tin alloys; ITER magnet; Nb/sub 3/Sn; Nb/sub 3/Sn cable-in-conduit conductor; critical current; current distribution; fast local field change; local magnetic field sensor; multistrand superconducting cable; pulsed operation; slow local field change; Critical current; Current distribution; Hall effect devices; Laboratories; Magnetic sensors; Sensor phenomena and characterization; Superconducting cables; Superconducting coils; Superconducting magnets; Testing;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.848307
  • Filename
    848307