• DocumentCode
    1351085
  • Title

    Reduction of fiber alignment shifts in semiconductor laser module packaging

  • Author

    Cheng, Wood-Hi ; Sheen, Maw-Tyan ; Chien, Chih-Pen ; Chang, Hung-Lun ; Kuang, Jao-Hwa

  • Author_Institution
    Inst. of Electro-Opt. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • Volume
    18
  • Issue
    6
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    842
  • Lastpage
    848
  • Abstract
    The thermally induced fiber alignment shifts of fiber-solder-ferrule (FSF) joints in laser module packaging have been studied experimentally and numerically. From direct measurements of the metallographic photos with and without temperature cycling, fiber displacement shifts of up to a 0.8 /spl mu/m were found after undergoing 500 temperature cycles. Experimental results show that the fiber shifts increase as the temperature cycle number and the initial fiber eccentric offset increase. The major cause of fiber shift may come from the plastic solder yielding introduced by the thermal stress variation and the redistribution of the residual stresses during temperature cycling. A finite-element method (FEM) analysis was performed to evaluate the variation of thermal stresses, the distribution of residual stresses, and fiber shifts of the FSF joints. Experimental measurements were in reasonable agreement with the numerical calculations. Both results indicate that the initial offset introduced in the fiber soldering process is a key parameter in causing the thermally-induced fiber shift of FSF joints in laser module packaging. The fiber shift, and hence fiber alignment shift under temperature cycling tests can be reduced significantly if the fiber can be located close to the center of the ferrule.
  • Keywords
    internal stresses; life testing; modules; optical fibre couplers; optical testing; semiconductor device packaging; semiconductor lasers; thermal stresses; fiber alignment shifts; fiber displacement shifts; fiber eccentric offset increase; fiber soldering process; fiber-solder-ferrule joints; finite-element method; metallographic photos; residual stresses; semiconductor laser module packaging; temperature cycle number; temperature cycles; temperature cycling; temperature cycling tests; thermal stress variation; thermal stresses; thermally induced fiber alignment shifts; Displacement measurement; Fiber lasers; Optical fiber testing; Plastics; Residual stresses; Semiconductor device packaging; Semiconductor lasers; State feedback; Temperature; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.848395
  • Filename
    848395