DocumentCode :
1351085
Title :
Reduction of fiber alignment shifts in semiconductor laser module packaging
Author :
Cheng, Wood-Hi ; Sheen, Maw-Tyan ; Chien, Chih-Pen ; Chang, Hung-Lun ; Kuang, Jao-Hwa
Author_Institution :
Inst. of Electro-Opt. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Volume :
18
Issue :
6
fYear :
2000
fDate :
6/1/2000 12:00:00 AM
Firstpage :
842
Lastpage :
848
Abstract :
The thermally induced fiber alignment shifts of fiber-solder-ferrule (FSF) joints in laser module packaging have been studied experimentally and numerically. From direct measurements of the metallographic photos with and without temperature cycling, fiber displacement shifts of up to a 0.8 /spl mu/m were found after undergoing 500 temperature cycles. Experimental results show that the fiber shifts increase as the temperature cycle number and the initial fiber eccentric offset increase. The major cause of fiber shift may come from the plastic solder yielding introduced by the thermal stress variation and the redistribution of the residual stresses during temperature cycling. A finite-element method (FEM) analysis was performed to evaluate the variation of thermal stresses, the distribution of residual stresses, and fiber shifts of the FSF joints. Experimental measurements were in reasonable agreement with the numerical calculations. Both results indicate that the initial offset introduced in the fiber soldering process is a key parameter in causing the thermally-induced fiber shift of FSF joints in laser module packaging. The fiber shift, and hence fiber alignment shift under temperature cycling tests can be reduced significantly if the fiber can be located close to the center of the ferrule.
Keywords :
internal stresses; life testing; modules; optical fibre couplers; optical testing; semiconductor device packaging; semiconductor lasers; thermal stresses; fiber alignment shifts; fiber displacement shifts; fiber eccentric offset increase; fiber soldering process; fiber-solder-ferrule joints; finite-element method; metallographic photos; residual stresses; semiconductor laser module packaging; temperature cycle number; temperature cycles; temperature cycling; temperature cycling tests; thermal stress variation; thermal stresses; thermally induced fiber alignment shifts; Displacement measurement; Fiber lasers; Optical fiber testing; Plastics; Residual stresses; Semiconductor device packaging; Semiconductor lasers; State feedback; Temperature; Thermal stresses;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/50.848395
Filename :
848395
Link To Document :
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