Heavy Ion Testing With Iron at 1 GeV/amu

Author

Pellish, Jonathan A. ; Xapsos, Michael A. ; LaBel, Kenneth A. ; Marshall, Paul W. ; Heidel, David F. ; Rodbell, Kenneth P. ; Hakey, Mark C. ; Dodd, Paul E. ; Shaneyfelt, Marty R. ; Schwank, James R. ; Baumann, Robert C. ; Deng, Xiaowei ; Marshall, Andrew

Author_Institution

GSFC, Radiat. Effects & Anal. Group, NASA, Greenbelt, MD, USA

Volume

57

Issue

5

fYear

2010

Firstpage

2948

Lastpage

2954

Abstract

A 1 GeV/amu ⁵⁶Fe ion beam allows for true 90° tilt irradiations of various microelectronic components and reveals relevant upset trends at the GCR flux energy peak. Three SRAMs and an SRAM-based FPGA evaluated at the NASA Space Radiation Effects Laboratory demonstrate that a 90° tilt irradiation yields a unique device response. These tilt angle effects need to be screened for, and if found, pursued with radiation transport simulations to quantify their impact on event rate calculations.

Keywords

SRAM chips; field programmable gate arrays; gas cooled reactors; ion beam effects; iron; nuclear electronics; 90° tilt irradiations; ⁵⁶Fe ion beam; GCR flux energy peak; NASA Space Radiation Effects Laboratory; SRAM-based FPGA; event rate calculations; heavy ion testing; iron; microelectronic components; Arrays; Bars; CMOS integrated circuits; Iron; NASA; Random access memory; Testing; FPGA; SRAM; galactic cosmic ray; heavy ion testing;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2010.2066575

Filename

5603462