DocumentCode :
1352241
Title :
Low-Noise Analog ASIC for Silicon and CdTe Sensors
Author :
Kishishita, Tetsuichi ; Sato, Goro ; Ikeda, Hirokazu ; Takahashi, Tadayuki ; Kiyuna, Tatsuya ; Mito, Yoshio
Author_Institution :
Phys. Inst., Univ. of Bonn, Bonn, Germany
Volume :
57
Issue :
5
fYear :
2010
Firstpage :
2971
Lastpage :
2977
Abstract :
We report on the recent development of a 32-channel low-noise analog front-end ASIC "KW03" for hard X-ray and gamma-ray detectors. The ASIC aims for the readout of strip or pixel (pad) detectors utilizing silicon and cadmium telluride (CdTe) as detector materials. Each readout channel includes a charge-sensitive amplifier, bandpass filters and a sample-and-hold circuit. It also includes a leakage current compensation and pole-zero cancellation circuits to meet the various detector requirements. The equivalent noise level of a typical channel reaches 89 e- @ 0 pF (rms) and shows an input-capacitance characteristic of 7.5 e-/pF between 0 pF and 10 pF with a power consumption of 3 mW per channel. We mounted the ASIC on a low-temperature co-fired ceramic (LTCC) package and evaluated the spectral performance by combining with a CdTe diode detector. As a result, the gamma-ray spectrum of radioactive source 241 Am was obtained with a good energy resolution of 2.23 keV (FWHM) for gamma rays of 59.5 keV at -20°C.
Keywords :
X-ray detection; application specific integrated circuits; electric sensing devices; electron device noise; gamma-ray detection; gamma-ray spectra; readout electronics; semiconductor counters; ASIC; CdTe diode detector; CdTe sensors; application specific integrated circuits; bandpass filters; charge-sensitive amplifier; gamma-ray detector; gamma-ray spectrum; hard X-ray detector; leakage current compensation; low-noise analog front-end; low-temperature co-fired ceramic package; pole-zero cancellation circuits; radioactive source; sample-and-hold circuit; silicon sensors; strip readout; Application specific integrated circuits; CMOS integrated circuits; Detectors; FETs; Logic gates; Noise; Resistance; ASIC; Analog front-end; CdTe; VLSI; X-ray; gamma-ray; low-noise;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2010.2063038
Filename :
5603463
Link To Document :
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