Title :
Support vector machine-based inspection of solder joints using circular illumination
Author :
Yun, T.S. ; Sim, K.J. ; Kim, H.J.
Author_Institution :
Dept. of Comput. Eng., Kyungpook Nat. Univ., Taegu, South Korea
fDate :
5/25/2000 12:00:00 AM
Abstract :
A method for inspecting solder joints using support vector machines (SVMs) and a tiered circular illumination technique is proposed. The illumination technique provides visual information that allows the 3D shape of the solder joint surface to be determined. The extracted features are used to classify the solder joint using an SVM classifier. Experimental results show the effectiveness of the proposed method.
Keywords :
automatic optical inspection; 3D shape; AOI; SVM classifier; extracted features; solder joint inspection; solder joint surface; support vector machine-based inspection; tiered circular illumination technique;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20000342