DocumentCode :
1352290
Title :
High frequency permittivity determination by spectra simulation and measurement of microstrip ring resonators
Author :
Semouchkina, E. ; Cao, W. ; Lanagan, M.
Author_Institution :
Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
Volume :
36
Issue :
11
fYear :
2000
fDate :
5/25/2000 12:00:00 AM
Firstpage :
956
Lastpage :
958
Abstract :
The S21 spectra of microstrip ring resonators have been measured experimentally and also computed using the finite-difference time-domain (FDTD) method. The dielectric constant of the substrate was determined by fitting the simulation results to the experimental data. The results are more self-consistent than those obtained using the Wheeler-Hammerstad method.
Keywords :
microstrip resonators; S-parameter spectra measurement; dielectric constant; finite difference time domain simulation; high frequency permittivity; microstrip ring resonator;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20000717
Filename :
848989
Link To Document :
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