• DocumentCode
    1352290
  • Title

    High frequency permittivity determination by spectra simulation and measurement of microstrip ring resonators

  • Author

    Semouchkina, E. ; Cao, W. ; Lanagan, M.

  • Author_Institution
    Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
  • Volume
    36
  • Issue
    11
  • fYear
    2000
  • fDate
    5/25/2000 12:00:00 AM
  • Firstpage
    956
  • Lastpage
    958
  • Abstract
    The S21 spectra of microstrip ring resonators have been measured experimentally and also computed using the finite-difference time-domain (FDTD) method. The dielectric constant of the substrate was determined by fitting the simulation results to the experimental data. The results are more self-consistent than those obtained using the Wheeler-Hammerstad method.
  • Keywords
    microstrip resonators; S-parameter spectra measurement; dielectric constant; finite difference time domain simulation; high frequency permittivity; microstrip ring resonator;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20000717
  • Filename
    848989
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1352290