• DocumentCode
    1352385
  • Title

    Distribution of LRT for Testing the Equality of Several 2-Parameter Exponential Distributions

  • Author

    Nagarsenker, Brahmanand N. ; Nagarsenker, Panna B.

  • Author_Institution
    Department of Mathematics; Air Force Institute of Technology; Wright-Patterson AFB, Ohio 45433, USA.
  • Issue
    1
  • fYear
    1985
  • fDate
    4/1/1985 12:00:00 AM
  • Firstpage
    65
  • Lastpage
    68
  • Abstract
    Exact distribution of the likelihood-ratio-test (LRT) criterion for testing the equality of several 2-parameter exponential distributions is obtained for the first time in a computational closed form. This is then used to obtain the s-significance points of the LRT.
  • Keywords
    Art; Distributed computing; Exponential distribution; Light rail systems; Military computing; Monte Carlo methods; Reliability theory; Statistical analysis; Statistical distributions; Testing; Exact distribution; Exponential distribution; Likelihood ratio test;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1985.5221933
  • Filename
    5221933
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1352385