DocumentCode
1352423
Title
Implementation of BIC monitor in balanced analogue self-test
Author
Sidiropulos, M. ; Stopjakova, V. ; Manhaeve, H.
Author_Institution
Dept. of Microelectron., Tech. Univ. of Brno, Brno, Czech Republic
Volume
32
Issue
20
fYear
1996
fDate
9/26/1996 12:00:00 AM
Firstpage
1841
Lastpage
1842
Abstract
The authors present the design of a dynamic built-in current (BIC) monitor for a new on-chip analogue self-test methodology. This methodology uses dynamic power supply current monitoring, and takes advantage of a redundancy in the structure of fully balanced circuits. The dynamic BIC monitor is based on a second generation current conveyor CCII+, and offers accurate measurement of supply current with minimal degradation in power supply voltage
Keywords
analogue integrated circuits; automatic testing; built-in self test; current conveyors; electric current measurement; integrated circuit testing; monitoring; BIC monitor; CCII; balanced analogue self-test; dynamic built-in current monitor; dynamic power supply current monitoring; fully balanced circuits; onchip analogue self-test methodology; redundancy; second generation current conveyor; supply current measurement;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19961297
Filename
535143
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