• DocumentCode
    1352553
  • Title

    A Comparison of Three Methods for Calculating Lower Confidence Limits on System Reliability Using Binomial Component Data

  • Author

    Martz, H.F. ; Duran, B.S.

  • Author_Institution
    Group S-1, MS F600; Los Alamos National Laboratory; Los Alamos, NM 87545 USA.
  • Issue
    2
  • fYear
    1985
  • fDate
    6/1/1985 12:00:00 AM
  • Firstpage
    113
  • Lastpage
    120
  • Abstract
    The Maximus, bootstrap, and Bayes methods can be useful in calculating lower s-confidence limits on system reliability using binomial component test data. The bootstrap and Bayes methods use Monte Carlo simulation, while the Maximus method is closed-form. The Bayes method is based on noninformative component prior distributions. The three methods are compared by means of Monte Carlo simulation using 20 simple through moderately complex examples. The simulation was generally restricted to the region of high reliability components. Sample coverages and average interval lengths are both used as performance measures. In addition to insights regarding the adequacy and desirability of each method, the comparison reveals the following regions of superior performance: 1. The Maximus method is generally superior for: a) moderate to large series systems of reliable components with small quantities of test data per component, and b) small series systems of repeated components. 2. The bootstrap method is generally superior for highly reliable and redundant systems. 3. The Bayes method is generally superior for: a) moderate to large series systems of reliable components with moderate to large numbers of component tests, and b) small series systems of reliable non-repeated components.
  • Keywords
    Fault trees; Laboratories; Monte Carlo methods; Probability; Reliability theory; Risk analysis; Risk management; Statistical analysis; System testing; Uncertainty; Bayes method; Binomial test data; Bootstrap; System reliability; s-confidence limit;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1985.5221967
  • Filename
    5221967