Title :
An Accurate Bidirectional Transmission Gate Using Semiconductor Diodes
Author :
Fullwood, R. ; Spiegel, P.
Author_Institution :
Physics Dept., Univ. of Pennsylvania, Philadelphia, Pa.
Keywords :
Boolean functions; Bridge circuits; Circuit testing; Current measurement; Electrical resistance measurement; Gaussian processes; Magnetic field measurement; Protons; Semiconductor diodes; Voltage;
Journal_Title :
Electronic Computers, IRE Transactions on
DOI :
10.1109/TEC.1959.5222065