Title :
Self-Dual Symmetric Switching Functions with a Certain a-Number Constraint
Author_Institution :
Dept. of Mathematics, University of Illinois, Urbana, Ill.
Keywords :
Boolean functions; Bridge circuits; Circuit testing; Current measurement; Electrical resistance measurement; Gaussian processes; Magnetic field measurement; Protons; Semiconductor diodes; Voltage;
Journal_Title :
Electronic Computers, IRE Transactions on
DOI :
10.1109/TEC.1959.5222066
