Title :
Unified model for junction size, substrate doping, and energy dependence of α-particle-induced charge collection
Author_Institution :
Dept. of Electron. Eng., Ewha Womans Univ., Seoul, South Korea
fDate :
9/26/1996 12:00:00 AM
Abstract :
A model for the α-particle-induced charge collection has been developed. By accounting for the funnelling and diffusion charges separately, our model accurately describes the junction size dependence of collected charge for a wide range of junction sizes, substrate doping levels, and α-particle energies
Keywords :
DRAM chips; alpha-particle effects; integrated circuit modelling; α-particle-induced charge collection; DRAM; diffusion charges; energy dependence; funnelling charges; junction size; model; substrate doping;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19961270