DocumentCode :
1353142
Title :
Tuning of Graphene Properties via Controlled Exposure to Electron Beams
Author :
Liu, G. ; Teweldebrhan, D. ; Balandin, A.A.
Author_Institution :
Dept. of Electr. Eng., Univ. of California at Riverside, Riverside, CA, USA
Volume :
10
Issue :
4
fYear :
2011
fDate :
7/1/2011 12:00:00 AM
Firstpage :
865
Lastpage :
870
Abstract :
The controlled modification of graphene properties is essential for its proposed electronic applications. Here, we describe a possibility of tuning electrical properties of graphene via electron-beam (e-beam) irradiation. We show that by controlling the irradiation dose one can change the carrier mobility and increase the resistance at the minimum conduction point in the single layer graphene. The bilayer graphene is less susceptible to the e-beam irradiation. The modification of graphene properties via irradiation can be monitored and quantified by the changes in the disorder D peak in Raman spectrum of graphene. The obtained results may lead to a new method of defect engineering of graphene physical properties. They are also important implications for fabrication of graphene nanodevices, which involve scanning electron microscopy and e-beam lithography.
Keywords :
Raman spectra; carrier mobility; crystal defects; electron beam effects; electron beam lithography; graphene; multilayers; scanning electron microscopy; C; Raman spectrum; bilayer graphene; carrier mobility; conduction point; defect engineering; electron beam irradiation; electron beam lithography; graphene nanodevices; graphene physical properties; graphene properties; scanning electron microscopy; single layer graphene; tuning electrical properties; Conductivity; Contact resistance; Electric variables measurement; Electron beams; Logic gates; Radiation effects; Resistance; Defects in graphene; Raman spectroscopy; disordered graphene; electron-beam (e-beam) irradiation; graphene devices;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2010.2087391
Filename :
5604319
Link To Document :
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