Title :
Sequential Tests of Hypotheses for System Reliability Modeled by a 2-Parameter Weibull Distribution
Author :
Harter, H.Leon ; Moore, Albert H. ; Wiegand, Rudolf P.
Author_Institution :
Air Force Institute of Technology, Wright-Patterson AFB, 32 South Wright Avenue; Dayton, Ohio 45403 USA.
Abstract :
For the 2-parameter Weibull distribution, truncated sequential tests are developed for the null hypothesis R = R0 against the alternative hypothesis R = R1 which are based on the logarithm of the likelihood ratio. Wald upper and lower bounds for a sequential test are modified by Monte Carlo methods using a Monte Carlo sample size of 2000 to yield the desired ¿ and à errors. Results are given for null hypothesis R0 = 0.9 vs. an alternative hypothesis R1 = 0.729, 0.81, 0.854 for (¿, Ã) = (0.2, 0.2), (0.1, 0.2) and (0.1, 0.1). Monte Carlo verification of the boundaries, again based on a Monte Carlo sample size of 2000 runs, yielded ¿ and à values consistent with Monte Carlo sampling error. The average sample size of the sequential tests result in a saving of about 40% of the values needed for the corresponding fixed sample test. Therefore we have developed and verified a useful sequential test for the reliability of systems whose failure are modeled by the 2-parameter Weibull distribution.
Keywords :
Exponential distribution; Monte Carlo methods; Reliability theory; Robustness; Sequential analysis; Shape; Statistical analysis; Statistical distributions; System testing; Weibull distribution; Monte Carlo; Sequential test of hypothesis; Weibull distribution;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1985.5222187