DocumentCode :
1353690
Title :
2012 IEEE International Reliabilty Physics Symposium (IRPS)
Volume :
58
Issue :
11
fYear :
2011
Firstpage :
4116
Lastpage :
4116
Abstract :
Provides a listing of upcoming conference events of interest to practitioners and researchers.
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2172703
Filename :
6052190
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1353690