Title :
Elimination of shunting conductance effects in a low-cost capacitive-sensor interface
Author :
Li, Xiujun ; Meijer, Gerard C M
Author_Institution :
Fac. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands
fDate :
6/1/2000 12:00:00 AM
Abstract :
A low-cost and reliable interface for capacitive sensors, based on the use of a relaxation oscillator and a microcontroller, is presented. The novel interface system is designed to measure small capacitances in a reliable and accurate way even when the sensor capacitors are shunted by parasitic conductances. The problem of shunting conductances is solved by performing a series of eight measurements and using a new auto-calibration technique. Moreover, all multiplicative and additive errors of the interface are also eliminated by using this new auto-calibration technique. In the microcontroller, the final result is calculated based on the new measurement algorithm. A prototype has been built and tested. Experimental results show that the interface is able to measure a capacitance of 0-1.2 pF with a shunting conductance of up to 0.42 μS, with a resolution and a relative accuracy of 0.03% and ±0.15%, respectively. The measurement time is about 400 ms
Keywords :
calibration; capacitive sensors; computerised instrumentation; electric admittance; intelligent sensors; measurement errors; microcontrollers; relaxation oscillators; 0 to 1.2 pF; additive errors; auto-calibration technique; electrical model; low-cost capacitive-sensor interface; measurement algorithm; microcontroller; modified Martin oscillator; multiplicative errors; relaxation oscillator; shunting conductance effects elimination; small capacitances measurement; smart sensor; Capacitance measurement; Capacitive sensors; Capacitors; Microcontrollers; Oscillators; Parasitic capacitance; Performance evaluation; Prototypes; Sensor systems; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on