Title :
Improving the Accuracy of the Littlewood-Verrall Model
Author :
Catuneanu, Vasile M. ; Mihalache, Adrian N.
Author_Institution :
Polytechnic Institute Bucharest; Dept of Electronics; Splaiul Independentei 303; Bucharest, R. S. ROMANIA.
Abstract :
A Bayes model of a system with stochastically monotonous failure rate, proposed by Littlewood & Verrall, has been tested in a simulated experiment. We show that the model can be improved by introducing pseudo-failures in order to enrich the input data. This leads to a greater accuracy in most predictions and makes the model more adaptive to the data.
Keywords :
Accuracy; Analytical models; Failure analysis; Monte Carlo methods; Predictive models; Shape; Software reliability; Software testing; System testing; Uncertainty; Bayes analysis; Littlewood-Verrall model; Monte Carlo simulation; Pseudo-failure; Software reliability;
Journal_Title :
Reliability, IEEE Transactions on
DOI :
10.1109/TR.1985.5222220
