The noise power ratio-theory and ADC testing

Author

Irons, Fred H. ; Riley, Kirk J. ; Hummels, Donald M. ; Friel, Greg A.

Author_Institution

Commun. Applications & Devices Group, Maine Univ., Orono, ME, USA

Volume

49

Issue

3

fYear

2000

fDate

6/1/2000 12:00:00 AM

Firstpage

659

Lastpage

665

Abstract

This paper develops the theory behind the noise power ratio (NPR) testing of analog-to-digital converters (ADC´s). A mid-riser formulation is used for mathematical simplicity. Both simulated and measured results, using digital-to-analog converter (DAC) generated signals, suggests that the uniformly distributed signal is more sensitive to amplitude dependent distortion

Keywords

Gaussian noise; analogue-digital conversion; harmonic distortion; integrated circuit noise; integrated circuit testing; quantisation (signal); transfer functions; waveform analysis; ADC testing; DAC generated signals; Gaussian noise distribution; amplitude dependent distortion; harmonic distortion effects; mid-riser formulation; noise power ratio; quantization; random broadband signals; random noise; transfer function alignment; uniform noise distribution; uniformly distributed signal; Analog-digital conversion; Digital-analog conversion; Frequency; Noise generators; Noise shaping; Sampling methods; Signal generators; Signal to noise ratio; Testing; Wideband;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.850411

Filename

850411