• DocumentCode
    1353971
  • Title

    A high-sensitivity particle monitor using an integration sphere

  • Author

    Watanabe, Kenzo ; Yamaguchi, Tomuo ; Nakayama, Masakatsu ; Gao, Yi-Zhu ; Nagasawa, Tadashi ; Ozawa, Taiyo

  • Author_Institution
    Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
  • Volume
    49
  • Issue
    3
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    679
  • Lastpage
    684
  • Abstract
    A particle monitor is developed for real-time measurement of dust concentration measured in living and working environments. The principle of the device is based on the optical scattering method. An integration sphere is used to collect the light scattered by dust onto a photo-detector (PD). A double-modulated laser system, a low-noise current-to-voltage converter and a synchronous demodulator for averaging are used for the optical source and detector, respectively, to enhance the signal-to-noise ratio (SNR). Individual performances of the optical and signal processing units indicate that a dust concentration lower than 0.2 μg/m3 is detectable, but the minimum detectable concentration of an assembled prototype monitor is limited to 5 μg/m 3. This may be due to diffracted light and optical misalignment
  • Keywords
    air pollution measurement; computerised monitoring; dust; light scattering; measurement by laser beam; optical information processing; signal processing equipment; SNR; averaging; current-to-voltage converter; diffracted light; double-modulated laser; dust concentration; high-sensitivity particle monitor; integration sphere; light scattering; living environment; optical misalignment; optical processing; optical scattering; photodetector; real-time measurement; signal-to-noise ratio; synchronous demodulator; working environment; Assembly; Demodulation; Light scattering; Monitoring; Optical detectors; Optical scattering; Optical signal processing; Particle measurements; Particle scattering; Signal to noise ratio;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.850414
  • Filename
    850414