DocumentCode :
1354179
Title :
Some Aspects of Reliability Growth
Author :
Gottfried, Paul
Author_Institution :
Consultant; 9251 Three Oaks Drive; Silver Spring, Maryland 20901 USA.
Issue :
1
fYear :
1987
fDate :
4/1/1987 12:00:00 AM
Firstpage :
11
Lastpage :
16
Abstract :
Reliability growth is examined with the use of a variant of the Duane model. This variant is based on stepwise growth and avoids some of the mathematical and philosophic dificulties associated with the Duane model. Monte Carlo simulation, while confirming the noisy behavior of reliability growth data, indicates that central tendencies are sufficiently strong to justify the use of Gaussian approximations for analysis of some aspects of growth. Some exact methods and some approximations for parameter estimation are presented.
Keywords :
Gaussian approximation; Gaussian noise; Maximum likelihood estimation; Monte Carlo methods; Parameter estimation; Silver; Springs; Stochastic processes; Testing; Vehicles; Duane model; Point process; Reliability growth;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1987.5222284
Filename :
5222284
Link To Document :
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