DocumentCode
1354502
Title
Correlation between anomalous latch-up I /V characteristics and observation of current distribution by IR microscopy in CMOS ICs
Author
Canali, Carlo ; Corsi, F. ; Zanoni, Enrico ; Muschitiello, Michele
Author_Institution
Dipartimento di Elettronica ed Inf., Padova Univ.
Volume
24
Issue
4
fYear
1988
fDate
2/18/1988 12:00:00 AM
Firstpage
204
Lastpage
205
Abstract
IR microscopy allows the correlation of anomalous latch-up electrical characteristics with current distribution in CMOS ICs, showing that anomalous behaviour is due to the competition of different pnpn paths and consequent current redistribution
Keywords
CMOS integrated circuits; current distribution; integrated circuit testing; optical microscopy; CMOS ICs; IR microscopy; anomalous latch-up; characteristics; current distribution; current redistribution; pnpn paths;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
Filename
5605
Link To Document