DocumentCode :
1354723
Title :
High mobility tri-layer a-Si:H thin-film transistors with ultrathin active layer
Author :
Thomasson, D.B. ; Jackson, T.N.
Author_Institution :
Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
Volume :
18
Issue :
8
fYear :
1997
Firstpage :
397
Lastpage :
399
Abstract :
We show that hydrogenated amorphous silicon thin-film transistors (a-Si:H TFT´s) with active layer thickness of 13 nm perform better for display applications than devices with thicker 50-nm active layers. A direct comparison of a-Si:H TFT´s fabricated using an i-stopper TFT structure shows that ultrathin active layers significantly improve the device characteristics. For a 5-μm channel length TFT, the linear region (V/sub DS/=0.1 V) and saturation region mobilities increase from 0.4 cm2/V/spl middot/s and 0.7 cm2/V/spl middot/s for a 50-nm thick active layer a-Si:H device to 0.7 cm2/V/spl middot/s and 1.2 cm2/V/spl middot/s for a 13-nm thick active layer a-Si:H layer device fabricated with otherwise identical geometry and processing.
Keywords :
amorphous semiconductors; carrier mobility; elemental semiconductors; hydrogen; silicon; thin film transistors; AMLCD; Si:H; carrier mobility; hydrogenated amorphous silicon; i-stopper; linear region; saturation region; tri-layer a-Si:H thin-film transistor; ultrathin active layer; Active matrix liquid crystal displays; Amorphous silicon; Crystalline materials; Dielectric substrates; Etching; Geometry; Liquid crystal displays; Manufacturing; Passivation; Thin film transistors;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/55.605452
Filename :
605452
Link To Document :
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