DocumentCode
1354939
Title
Comment on: Sequential Tests of Hypotheses for System-Reliability Modeled by a 2-Parameter Weibull Distribution
Author
Ascher, Harold
Author_Institution
Code 5326; Naval Research Laboratory; Washington, DC 20375-5000 USA.
Issue
4
fYear
1987
Firstpage
390
Lastpage
391
Abstract
A different point of view is presented on the content of the original paper.
Keywords
Laboratories; Random variables; Reliability theory; Sequential analysis; Sockets; System testing; Weibull distribution; MIL-STD-781; Repairable system; Weibull distribution; Weibull renewal process;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1987.5222420
Filename
5222420
Link To Document