DocumentCode :
1355279
Title :
Automated Design Debugging With Maximum Satisfiability
Author :
Chen, Yibin ; Safarpour, Sean ; Marques-Silva, Joao ; Veneris, Andreas
Author_Institution :
Vennsa Technol., Inc., Toronto, ON, Canada
Volume :
29
Issue :
11
fYear :
2010
Firstpage :
1804
Lastpage :
1817
Abstract :
As contemporary very large scale integration designs grow in complexity, design debugging has rapidly established itself as one of the largest bottlenecks in the design cycle today. Automated debug solutions such as those based on Boolean satisfiability (SAT) enable engineers to reduce the debug effort by localizing possible error sources in the design. Unfortunately, adaptation of these techniques to industrial designs is still limited by the performance and capacity of the underlying engines. This paper presents a novel formulation of the debugging problem using MaxSAT to improve the performance and applicability of automated debuggers. Our technique not only identifies errors in the design but also indicates when the bug is excited in the error trace. MaxSAT allows for a simpler formulation of the debugging problem, reducing the problem size by 80% compared to a conventional SAT-based technique. Empirical results demonstrate the effectiveness of the proposed formulation as run-time improvements of 4.5 × are observed on average. This paper introduces two performance improvements to further reduce the time required to find all error sources within the design by an order of magnitude.
Keywords :
VLSI; integrated circuit design; Boolean satisfiability; MaxSAT; automated debug solutions; automated debuggers; automated design debugging; debugging problem; design debugging; run-time improvements; simpler formulation; very large scale integration designs; Clocks; Combinational circuits; Debugging; Integrated circuit modeling; Logic gates; Multiplexing; Sequential circuits; Debugging; diagnosis; satisfiability; verification; very large scale integration;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2010.2061270
Filename :
5605301
Link To Document :
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