Title :
Fast Node Merging With Don´t Cares Using Logic Implications
Author :
Chen, Yung-Chih ; Wang, Chun-Yao
Author_Institution :
Dept. of Comput. Sci., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Node merging is a popular and effective logic restructuring technique that has recently been applied to minimize logic circuits. However, in the previous satisfiability (SAT)-based methods, the search for node mergers required trial-and-error validity checking of a potentially large set of candidate mergers. Here, we propose a new method, which directly identifies node mergers using logic implications without any SAT solving calls. Although the efficiency benefits of the method come at the expense of quality, we further engage the redundancy removal and the wire replacement techniques to enhance its quality. The experimental results show that the proposed optimization method achieves approximately 46 times the speedup while possessing a competitive capability of circuit minimization compared to the state-of-the-art method.
Keywords :
circuit optimisation; logic circuits; minimisation; circuit minimization; don´t cares; fast node merging; logic circuits; logic implications; logic restructuring technique; optimization method; redundancy removal; trial-and-error validity checking; wire replacement techniques; Benchmark testing; Circuit faults; Computational modeling; Corporate acquisitions; Integrated circuit modeling; Logic gates; Wire; Algorithms; circuit optimization; node merging; observability don´t cares (ODCs);
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2010.2058510