Title :
Testing Random Defect and Process Variation Induced Comparison Faults of TCAMs With Asymmetric Cells
Author :
Li, Jin-Fu ; Huang, Yu-Jen ; Hu, Yong-Jyun
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
Abstract :
This paper presents a march-like testTAC-P to cover comparison faults of ternary content addressable memories (TCAMs) with asymmetric cells. The TAC-P only requires 4N Write operations and (3N+2B) Compare operations for an N ×B -bit TCAM with Hit and priority address encoder outputs. We show that the test also can cover search time failures induced by process variation in the comparison circuit of a TCAM. Furthermore, a test TMF for match failures induced by the process variation in the comparison circuit of a TCAM is also presented.
Keywords :
content-addressable storage; integrated circuit testing; asymmetric cells; comparison faults; match failures; priority address encoder outputs; process variation; ternary content addressable memories; testing random defect; Capacitance; Circuit faults; Clocks; Random access memory; System-on-a-chip; Testing; Transistors; Comparison faults; content addressable memories; march tests; memory testing;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2010.2072710
