DocumentCode :
1356114
Title :
Stratified Media Model for Terahertz Reflectometry of the Skin
Author :
Bennett, David B. ; Li, Wenzao ; Taylor, Zachary D. ; Grundfest, Warren S. ; Brown, Elliot R.
Volume :
11
Issue :
5
fYear :
2011
fDate :
5/1/2011 12:00:00 AM
Firstpage :
1253
Lastpage :
1262
Abstract :
Terahertz (THz) imaging has shown great potential as a tool for in vivo imaging of conditions which affect the hydration properties of the skin, including thermal burns, chemical irritation, and cancer. This work presents a composite model of skin based on hydration gradients measured in vivo by confocal Raman spectroscopy. Bruggeman mixing theory is used to compute the dielectric function profile of the skin model and stratified media calculations simulate the reflection spectrum of THz radiation from the skin. The reflected power in a skin reflectometry measurement is predicted to arise mostly from the hydration levels in the epidermis, where the optimal frequency band for imaging is found to be between 300 and 900 GHz. A THz reflectometry experiment is carried out on a drying polypropylene towel and the measured power trend is successfully simulated.
Keywords :
Raman spectroscopy; biomedical imaging; biomedical measurement; dielectric function; inhomogeneous media; microwave reflectometry; millimetre wave imaging; physiological models; skin; solvation; terahertz wave imaging; Bruggeman mixing theory; cancer; chemical irritation; confocal Raman spectroscopy; dielectric function profile; epidermis; frequency 300 GHz to 900 GHz; hydration; polypropylene; reflection spectrum; skin model; skin reflectometry measurement; stratified media model; terahertz imaging; terahertz reflectometry; thermal burns; Dielectrics; Epidermis; Imaging; Permittivity; Reflection; Reflectivity; Effective media theory; THz technology; Terahertz (THz) imaging; stratified media theory;
fLanguage :
English
Journal_Title :
Sensors Journal, IEEE
Publisher :
ieee
ISSN :
1530-437X
Type :
jour
DOI :
10.1109/JSEN.2010.2088387
Filename :
5605646
Link To Document :
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