Title :
Fault application system design for a 25kV distribution test feeder
Author :
Cheema, Harmeet ; Abbey, Craig ; Brissette, Yves ; Joos, Geza
Author_Institution :
McGill Univ., Montreal, QC, Canada
Abstract :
A 25kV distribution test line has been developed at IREQ that includes four distributed generators, controllable loads, and a storage system. The test line has advanced protection equipment and a simple fault application system that can generate bolted SLG faults. However, to test advanced devices and new protection schemes, different non-bolted faults need to be emulated. This paper discusses the design of the fault application system that can produce controllable impedance faults at different points on the wave. The simulation results are presented, which illustrate the design.
Keywords :
distributed power generation; power distribution faults; power distribution protection; IREQ; bolted SLG faults; controllable impedance faults; controllable loads; distributed generators; distribution test feeder; fault application system; fault application system design; nonbolted faults; protection equipment; storage system; voltage 25 kV; Circuit faults; Fault currents; Impedance; Radio frequency; Resistance; Substations; Switches; Power distribution faults; Power system protection; Power system simulation;
Conference_Titel :
PES General Meeting | Conference & Exposition, 2014 IEEE
Conference_Location :
National Harbor, MD
DOI :
10.1109/PESGM.2014.6939493