DocumentCode
13567
Title
Numerical Analysis of Electro-Optical Modulators Based on the Amorphous Silicon Technology
Author
Rao, Smitha ; Della Corte, Francesco G.
Author_Institution
Dipt. di Ing. dell´Inf., delle Infrastrutture e dell´Energia Sostenibile, Univ. degli Studi Mediterranea di Reggio Calabria, Reggio Calabria, Italy
Volume
32
Issue
13
fYear
2014
fDate
July1, 1 2014
Firstpage
2399
Lastpage
2407
Abstract
This paper reports about an efficient method for the numerical simulation of the electrical and optical characteristics, in both steady state and transient conditions, of free carrier injection- or depletion-based electro-optical active devices, based on the low cost technology of hydrogenated amorphous silicon (a-Si:H) and related semiconducting alloys, like a-SiC:H. In particular, our experimental results, recently achieved for low-loss, birefringence-free, single-mode waveguide-integrated phase modulators, are used to tune the many simulation parameters and validate the mixed electro-optic simulation environment. The tool is used to design a Mach-Zehnder Interferometer (MZI)-based modulator enhancing the performances of previous realized devices.
Keywords
Mach-Zehnder interferometers; amorphous semiconductors; electro-optical modulation; hydrogen; integrated optics; numerical analysis; optical design techniques; optical materials; optical waveguides; phase modulation; silicon; silicon compounds; Mach-Zehnder Interferometer-based modulator design; Si:H; SiC:H; amorphous silicon technology; birefringence-free integrated phase modulators; depletion-based electro-optical active devices; electrical characteristics; electro-optical modulator; free carrier injection-based electro-optical active devices; hydrogenated amorphous silicon; low cost technology; low-loss integrated phase modulators; mixed electro-optic simulation environment; numerical analysis; numerical simulation; optical characteristics; semiconducting alloys; simulation parameters; single-mode waveguide-integrated phase modulators; steady state; transient conditions; Charge carrier processes; Electrooptical waveguides; Optical device fabrication; Optical refraction; Optical variables control; Photonics; Amorphous materials; numerical simulation; photonic integrated circuits; silicon photonics;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2014.2325909
Filename
6819020
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