• DocumentCode
    1356897
  • Title

    Influence of a dielectric barrier on the stochastic behaviour of Trichel-pulse corona

  • Author

    Brunt, R. J Van ; Misakian, M. ; Kulkarni, S.V. ; Lakdawala, V.K.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    26
  • Issue
    3
  • fYear
    1991
  • fDate
    6/1/1991 12:00:00 AM
  • Firstpage
    405
  • Lastpage
    415
  • Abstract
    The influence of a solid polytetrafluorethylene (PTFE) dielectric barrier on the stochastic behaviour of negative (Trichel) pulse corona discharges in air is examined. This behavior is revealed from measurement of conditional and unconditional corona pulse-amplitude and pulse-time--separation distributions. The results indicate that the presence of a dielectric surface on the anode effectively reduces the electric field at the point electrode, but does not affect the occurrence of Trichel pulses, provided the point-to-plane gap spacing is greater than a critical value dc which depends on the area of the dielectric and the applied voltage. As the gap spacing approaches dc, the effect of dielectric-surface charging by the corona introduces measurable memory effects indicated by correlations between pulse amplitude and time separation from the previous pulse. For spacings less than dc, detachable corona-pulse activity is quenched by the presence of a quasi-permanent surface charge on the dielectric
  • Keywords
    corona; discharges (electric); stochastic processes; Trichel-pulse corona; corona pulse-amplitude; dielectric barrier; electric field; memory effects; point-to-plane gap spacing; polytetrafluorethylene; pulse-time--separation; quasi-permanent surface charge; stochastic behaviour; Anodes; Corona; Dielectric measurements; Electrodes; Pulse measurements; Solids; Stochastic processes; Surface discharges; Time measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/14.85111
  • Filename
    85111