• DocumentCode
    1356908
  • Title

    Multiphysics Modeling and Analysis of the Photoinductive Imaging Effect for Crack Detection

  • Author

    Tai, Cheng-Chi ; Pan, Yen-Lin

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    59
  • Issue
    2
  • fYear
    2010
  • Firstpage
    425
  • Lastpage
    432
  • Abstract
    Numerical multiphysics modeling of the photoinductive imaging (PI) effect was performed with a 2-D transient to characterize corner cracks at the edge of a specimen with a bolt hole. We present how the finite-element method (FEM) can be utilized to model the PI effect and observe the influence of critical factors on the coil probe impedance for a rectangular crack in the Ti-6Al-4V specimen. As anticipated, the proposed model can show that the PI method has a higher spatial resolution in the defect in 2-D models compared to the conventional eddy current testing method. The FEM simulation results for 0.25-, 0.50-, and 0.75-mm rectangular notches are shown and discussed. The effects of coil current frequency, laser-point temperature, and lift-off distance on the PI signal are also examined and analyzed. We demonstrate that the PI effect is a novel sensing method for characterizing the geometric shape of cracks and that the enhanced output signals of the coil probe can also be obtained given an appropriate quantity of factors.
  • Keywords
    crack detection; eddy current testing; finite element analysis; laser materials processing; optical images; 2-D transients; FEM; FEM simulation; coil current frequency; coil probe; coil probe impedance; crack detection; finite-element method; laser-point temperature; multiphysics modeling; numerical multiphysics modeling; photoinductive imaging effect; Crack detection; eddy current testing (ECT); finite-element method (FEM); modeling; nondestructive testing (NDT); photoinductive imaging (PI);
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2024369
  • Filename
    5223571