• DocumentCode
    1356919
  • Title

    Influence of Building Structures on the Lightning Return Stroke Current

  • Author

    Du, Y. ; Chen, M.L.

  • Author_Institution
    Dept. of Building Services Eng., Hong Kong Polytech. Univ., Kowloon, China
  • Volume
    25
  • Issue
    1
  • fYear
    2010
  • Firstpage
    307
  • Lastpage
    315
  • Abstract
    This paper addresses the influence of building structures on the lightning return stroke current. An equivalent circuit model of the lightning channel is set up using the coupled ??-type circuit. This model is then integrated with the building structure via the lightning attachment and the mutual coupling. With this integrated circuit model, the lightning current in the building is evaluated using EMTP. It is found that the building generally behaves like a transmission line at its rooftop and on the ground. The rooftop current is the result of the incident lightning current and its subsequent reflected currents on the ground. The propagation parameters of the building can be determined numerically using the integrated model. These parameters vary with the structure type, size, and others. In general, the impedance of typical buildings lies between the channel impedance and grounding impedance, and the lightning current on the lower floors is higher. It is also found that excluding the mutual coupling in the integrated circuit model alters the waveform of the lightning current.
  • Keywords
    EMTP; building management systems; equivalent circuits; lightning protection; power transmission lines; EMTP; building structures; channel impedance; coupled ??-type circuit; equivalent circuit model; grounding impedance; incident lightning current; integrated circuit model; lightning channel; lightning return stroke current; mutual coupling; propagation parameters; transmission line; Building; equivalent circuit model; lightning return stroke current; transmission line model;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/TPWRD.2009.2035420
  • Filename
    5353624