• DocumentCode
    1357279
  • Title

    Tunneling injection lasers: a new class of lasers with reduced hot carrier effects

  • Author

    Bhattacharya, Pallab ; Singh, Jasprit ; Yoon, Howard ; Zhang, Xiangkun ; Gutierrez-Aitken, August ; Lam, Yeeloy

  • Author_Institution
    Solid State Electron. Lab., Michigan Univ., Ann Arbor, MI, USA
  • Volume
    32
  • Issue
    9
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    1620
  • Lastpage
    1629
  • Abstract
    In conventional quantum-well lasers, carriers are injected into the quantum wells with quite high energies. We have investigated quantum-well lasers in which electrons are injected into the quantum-well ground state through tunneling. The tunneling injection lasers are shown to have negligible gain compression, superior high-temperature performance, lower Auger recombination and wavelength chirp, and better modulation characteristics when compared to conventional lasers. The underlying physical principles behind the superior performance are also explored, and calculations and measurements of relaxation times in quantum wells have been made. Experimental results are presented for lasers made with a variety of material systems, InGaAs-GaAs-AlGaAs, InGaAs-GaAs-InGaAsP-InGaP, and InGaAs-InGaAsP-InP, for different applications. Both single quantum-well and multiple quantum-well tunneling injection lasers are demonstrated
  • Keywords
    carrier relaxation time; hot carriers; quantum well lasers; tunnelling; Auger recombination; InGaAs-GaAs-AlGaAs; InGaAs-GaAs-InGaAsP-InGaP; InGaAs-InGaAsP-InP; gain compression; ground state; high-temperature characteristics; hot carriers; modulation; multiple quantum-well laser; relaxation time; single quantum-well laser; tunneling injection laser; wavelength chirp; Chirp modulation; Electrons; Laser theory; Performance gain; Quantum well lasers; Radiative recombination; Spontaneous emission; Stationary state; Tunneling; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.535367
  • Filename
    535367