• DocumentCode
    1357352
  • Title

    Direct Tip Shape Determination of a Berkovich Indenter: Effect on Nanomechanical Property Measurement and Description of a Worn Indenter

  • Author

    Munoz-Paniagua, David J. ; McDermott, Mark T. ; Norton, Peter R. ; Tadayyon, Seyed M.

  • Author_Institution
    Nat. Inst. for Nanotechnol., Nat. Res. Council Canada, Edmonton, AB, Canada
  • Volume
    9
  • Issue
    4
  • fYear
    2010
  • fDate
    7/1/2010 12:00:00 AM
  • Firstpage
    487
  • Lastpage
    493
  • Abstract
    The minimization of sources of uncertainty in nanoindentation experiments is crucial for accurate determination of nanomechanical properties. A common source of uncertainty in these measurements is the estimation of tip shape and size. Besides the experimental determination of the indenter´s real geometry, determination of the instrument´s compliance is also necessary. We use an atomic-force-microscope-based procedure for the determination of nanoindentation tip parameters needed to account for errors induced by tip shape nonideality and to permit the evaluation of the relative contributions of the instrumental errors associated with the experimentally determined values of hardness and modulus. We compare the definitions of the currently used tip shape area function based on physically relevant parameters with the scan and propose a hyperbolic definition that meets all physically relevant criteria while being simple enough to yield good results with numerical nonlinear fitting routines.
  • Keywords
    atomic force microscopy; elastic moduli; error analysis; hardness; mechanical contact; nanoindentation; shape measurement; Berkovich indenter; atomic force microscopy; contact-area property; direct tip shape determination; elastic modulus; hardness; indenter geometry; instrumental errors; nanoindentation; tip shape area function; Contact-area characterization; elastic modulus testing; hardness testing; indentation;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2009.2030888
  • Filename
    5223654