Title :
The use of digital image processing for IC reverse engineering
Author :
Quijada, Raul ; Raventos, Alex ; Tarres, Francesc ; Dura, Roger ; Hidalgo, Soraya
Author_Institution :
Signal Theor. & Commun. Dept, UPC - Barcelona Tech, Barcelona, Spain
Abstract :
IC Reverse engineering is the process to analyze an integrated circuit to obtain information about its design, materials, logic circuitry, functionality, performance and other relevant features. The increasingly complexity of microchips using a greater number of layers and logic gates makes this process unaffordable when using traditional methods that rely on human inspection and analysis. Therefore, digital image processing is presented as a fruitful field for automation. In this paper a system for the circuitry extraction, analysis and presentation is described. It is divided in three blocks: 2D Image Tiling, Logic Gates Localization & Recognition and Microchip Navigator. The paper presents an overview of the complete system and is mainly based on the description of the image processing algorithms that are applied to the different blocks such as image stitching, customized Scale Invariant Feature Transform (SIFT) and logic gate localization & recognition.
Keywords :
image recognition; inspection; integrated circuit design; production engineering computing; reverse engineering; 2D image tiling; IC Reverse Engineering; circuitry extraction; digital image processing; image customization; image stitching; inspection; integrated circuit; logic gates localization; logic gates recognition; microchip navigator; scale invariant feature transforms; Mercury (metals); IC reverse engineering; Image stitching; mosaicing; object recognition;
Conference_Titel :
Multi-Conference on Systems, Signals & Devices (SSD), 2014 11th International
Conference_Location :
Barcelona
DOI :
10.1109/SSD.2014.6808796