• DocumentCode
    1358331
  • Title

    Dynamics of Broad-Area Semiconductor Lasers With Short Optical Feedback

  • Author

    Tachikawa, Tomokazu ; Takimoto, Satoshi ; Shogenji, Rui ; Ohtsubo, Junji

  • Author_Institution
    Fac. of Eng., Shizuoka Univ., Shizuoka, Japan
  • Volume
    46
  • Issue
    2
  • fYear
    2010
  • Firstpage
    140
  • Lastpage
    149
  • Abstract
    The dynamics of filamentations in broad-area semiconductor lasers with short optical feedback were numerically studied. Regular pulse packages similar to those observed in narrow-stripe edge-emitting semiconductor lasers were found as the feedback reflectivity is increased. However, the regular pulse packages consisted of a periodic envelope of the external cavity frequency and fine pulse trains of periodic filaments, which is different from the regular pulse packages observed in narrow-stripe edge-emitting semiconductor lasers. From the analysis for spatio-temporal near-field patterns, we found periodic undulations of the spatial and temporal filament sizes as the external mirror reflectivity was changed. We also investigated filtered optical feedback, where a part of the emitted beam is fed back into the laser cavity. The time-averaged near-field pattern was found to have a strong dependence on the feedback level in the case of spatial filtered optical feedback.
  • Keywords
    laser feedback; optical pulse generation; semiconductor lasers; spatial filters; spatiotemporal phenomena; broad-area semiconductor lasers; filamentations; laser cavity; mirror reflectivity; optical feedback; regular pulse packages; spatial filter; spatio-temporal near-field patterns; Frequency; Laser feedback; Mirrors; Optical feedback; Optical filters; Optical pulses; Pattern analysis; Reflectivity; Semiconductor device packaging; Semiconductor lasers; Broad-area semiconductor lasers; chaos; dynamic filamentations; nonlinear optics; short optical feedback;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2009.2031122
  • Filename
    5353811