Title :
0.5-V Low-
CMOS Preamplifier for Low-Power and High-Speed Gigabit-DRAM Arrays
Author :
Kotabe, Akira ; Yanagawa, Yoshimitsu ; Akiyama, Satoru ; Sekiguchi, Tomonori
Author_Institution :
Meas. Syst. Res. Dept., Hitachi, Ltd., Tokyo, Japan
Abstract :
A novel low-VT CMOS preamplifier was developed for low-power and high-speed gigabit DRAM arrays. The sensing time of a sense amplifier (SA) with the proposed preamplifier and its activation schemes at a data-line voltage of 0.5 V was 6 ns, which is 62% shorter than that of an SA using a conventional preamplifier. By activating the proposed preamplifier temporarily during the write cycle, the writing time was 16.3 ns, which is 72% shorter than the case without activation of the proposed preamplifier, and this time is short enough to apply a DRAM array using the proposed preamplifier to 1.6-Gbit/s/pin DDR3 SDRAM. The operating current of the memory array and its peripheral circuit including the proposed preamplifier was reduced by 12% by reducing the data-line voltage from 0.8 to 0.5 V.
Keywords :
CMOS analogue integrated circuits; DRAM chips; preamplifiers; CMOS preamplifier; activation schemes; bit rate 1.6 Gbit/s; data-line voltage; high-speed gigabit-DRAM arrays; peripheral circuit; sense amplifier; voltage 0.8 V to 0.5 V; voltage 5 V; CMOS integrated circuits; Latches; Logic gates; MOS devices; Power demand; Random access memory; Sensors; DRAM; low voltage; preamplifier; sense amplifier (SA);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2010.2065650