Read Performance Reliability in TMR Head

Author

Miyatake, Masami ; Kugiya, Fumio ; Kodama, Naoki

Author_Institution

Hitachi Global Storage Technol. Japan, Ltd., Fujisawa, Japan

Volume

12

Issue

1

fYear

2012

fDate

3/1/2012 12:00:00 AM

Firstpage

24

Lastpage

30

Abstract

Causes of head instability and design improvements in tunneling magnetoresistive heads are discussed. Head instability results in output signal amplitude changes and/or signal distortion due to the output noise. Under accelerated environmental conditions, a test using an original "V-H tester” was done to study and analyze the conditions of which instability occurs. From the result of the test, instability was classified into four categories. The improved sample heads were prepared, and the effectiveness was proved.

Keywords

magnetic heads; magnetoresistive devices; reliability; tunnelling magnetoresistance; TMR head; V-H tester; head instability; read performance reliability; signal amplitude; signal distortion; tunneling magnetoresistive heads; Acceleration; Magnetic fields; Magnetic heads; Magnetization; Magnetomechanical effects; Noise; Tunneling magnetoresistance; $Delta V{-}H$ tester; Instability; thermal fly-height control (TFC); tunneling magnetoresistive (TMR) head;

fLanguage

English

Journal_Title

Device and Materials Reliability, IEEE Transactions on

Publisher

ieee

ISSN

1530-4388

Type

jour

DOI

10.1109/TDMR.2011.2173200

Filename

6058631