• DocumentCode
    1359005
  • Title

    Accurate, Dense, and Robust Multiview Stereopsis

  • Author

    Furukawa, Yasutaka ; Ponce, Jean

  • Author_Institution
    Google Inc., Seattle, WA, USA
  • Volume
    32
  • Issue
    8
  • fYear
    2010
  • Firstpage
    1362
  • Lastpage
    1376
  • Abstract
    This paper proposes a novel algorithm for multiview stereopsis that outputs a dense set of small rectangular patches covering the surfaces visible in the images. Stereopsis is implemented as a match, expand, and filter procedure, starting from a sparse set of matched keypoints, and repeatedly expanding these before using visibility constraints to filter away false matches. The keys to the performance of the proposed algorithm are effective techniques for enforcing local photometric consistency and global visibility constraints. Simple but effective methods are also proposed to turn the resulting patch model into a mesh which can be further refined by an algorithm that enforces both photometric consistency and regularization constraints. The proposed approach automatically detects and discards outliers and obstacles and does not require any initialization in the form of a visual hull, a bounding box, or valid depth ranges. We have tested our algorithm on various data sets including objects with fine surface details, deep concavities, and thin structures, outdoor scenes observed from a restricted set of viewpoints, and "crowded" scenes where moving obstacles appear in front of a static structure of interest. A quantitative evaluation on the Middlebury benchmark [1] shows that the proposed method outperforms all others submitted so far for four out of the six data sets.
  • Keywords
    computer vision; stereo image processing; visual perception; global visibility constraints; local photometric consistency; patch model; robust multiview stereopsis; stereo expansion; stereo filtering; stereo matching; 3D/stereo scene analysis; Computer vision; modeling and recovery of physical attributes; motion; shape.;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2009.161
  • Filename
    5226635