Title :
Epitomic Location Recognition
Author :
Ni, Kai ; Kannan, Anitha ; Criminisi, Antonio ; Winn, John
Author_Institution :
Coll. of Comput., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper presents a novel method for location recognition, which exploits an epitomic representation to achieve both high efficiency and good generalization. A generative model based on epitomic image analysis captures the appearance and geometric structure of an environment while allowing for variations due to motion, occlusions, and non-Lambertian effects. The ability to model translation and scale invariance together with the fusion of diverse visual features yields enhanced generalization with economical training. Experiments on both existing and new labeled image databases result in recognition accuracy superior to state of the art with real-time computational performance.
Keywords :
object recognition; path planning; appearance structure; epitomic image analysis; epitomic location recognition; epitomic representation; geometric structure; model translation; non Lambertian effects; scale invariance; Location class recognition; epitomic image analysis; panoramic stitching.;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2009.165