DocumentCode :
1359080
Title :
A Class-G Supply Modulator and Class-E PA in 130 nm CMOS
Author :
Walling, Jeffrey S. ; Taylor, Stewart S. ; Allstot, David J.
Author_Institution :
Dept. of Electr. Eng., Univ. of Washington, Seattle, WA, USA
Volume :
44
Issue :
9
fYear :
2009
Firstpage :
2339
Lastpage :
2347
Abstract :
A class-G supply modulator utilizes parallel low- dropout (LDO) regulators that are controlled by comparators and negative feedback. It optimizes the power consumption of a nonlinear power amplifier (PA) operating with supply modulation, such that it draws current from one of multiple appropriately sized supply voltages as determined by the input signal envelope. The class-G modulator is used in conjunction with a class-E PA operating in an envelope elimination and restoration (EER) mode to efficiently amplify signals with large peak-to-average ratios. The measured maximum output power and power added efficiency (PAE) are 29.3 dBm and 69%, respectively. The class-G technique is demonstrated for a 64 QAM, OFDM input signal (symbol period = 4 mus) wherein the measured error vector magnitude (EVM) is 2.5% and the average efficiency of 22.6%.
Keywords :
CMOS analogue integrated circuits; OFDM modulation; modulators; power amplifiers; quadrature amplitude modulation; CMOS; OFDM; QAM; class-E PA; class-G supply modulator; efficiency 22.6 percent; efficiency 69 percent; envelope elimination and restoration mode; error vector magnitude; maximum output power; nonlinear power amplifier; parallel low- dropout regulators; power added efficiency; size 130 nm; supply modulation; time 4 mus; Energy consumption; Negative feedback; Peak to average power ratio; Power amplifiers; Power generation; Power measurement; Quadrature amplitude modulation; Regulators; Signal restoration; Voltage; Average efficiency; EER; class-E; class-G; envelope elimination and restoration; linearization; power added efficiency; power amplifier; supply modulation;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2009.2023191
Filename :
5226694
Link To Document :
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