DocumentCode :
1359282
Title :
Energy–Performance Tunable Logic
Author :
Nezamfar, Bita ; Alon, Elad ; Horowitz, Mark
Volume :
44
Issue :
9
fYear :
2009
Firstpage :
2554
Lastpage :
2567
Abstract :
We propose a new logic family that enables the user to tune the transistor´s effective threshold voltage after fabrication for higher speed or lower power. This technique along with dynamic voltage scaling allows simultaneous optimization of static and dynamic power based on the application/workload requirements. Programmable interconnect from an FPGA was implemented using this logic family on a 90 nm CMOS test chip. Measurements show that this topology provides twice the tuning range in the energy-performance space compared to a conventional interconnect utilizing only supply voltage scaling. For most of the performance range, this circuit consumes 35% less energy compared to a state-of-the-art design. The circuit is an externally static, internally pulse-mode topology which can replace static circuits without requiring significant changes to the system.
Keywords :
CMOS logic circuits; field programmable gate arrays; low-power electronics; network topology; CMOS test chip; FPGA; dynamic voltage scaling; energy performance tunable logic; field programmable gate arrays; logic family; programmable interconnect; pulse-mode topology; size 90 nm; static circuits; transistor effective threshold voltage; CMOS logic circuits; Circuit testing; Circuit topology; Dynamic voltage scaling; Fabrication; Field programmable gate arrays; Integrated circuit interconnections; Logic testing; Threshold voltage; Tunable circuits and devices; Adaptive supply scaling; FPGA; adaptive voltage scaling; digital logic; energy–performance optimization; inter connect;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2009.2025344
Filename :
5226760
Link To Document :
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