• DocumentCode
    135966
  • Title

    Characterizing power amplifier static AM/PM with spectrum analyzer measurements

  • Author

    Cunha, Telmo R. ; Cabral, Pedro M. ; Nunes, Luis C.

  • Author_Institution
    Dept. Eletron., Univ. de Aveiro, Aveiro, Portugal
  • fYear
    2014
  • fDate
    11-14 Feb. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Power amplifier (PA) behavior and distortion analysis requires the characterization of the PA nonlinear static input-output relationship, usually evaluated through the input amplitude to output amplitude, AM/AM, response. However, the PA input amplitude to output phase shift, AM/PM, behavior has an equivalent impact on distortion generation, and so it must be also measured. This can be obtained by vector signal analyzer (VSA) measurements, an expensive equipment that is not usually available at most microwave PA design laboratories. In this manuscript we demonstrate that both the AM/AM and AM/PM PA characterizations can be effectively performed from the spectral magnitude of continuous-wave, CW, and two-tone tests, not requiring any direct measurement of signal phase. This is very important since it enables the full AM/AM and AM/PM PA characterization to be performed with a typical spectrum analyzer, a common equipment in all RF and microwave laboratories.
  • Keywords
    amplitude modulation; distortion; microwave power amplifiers; network analysers; pulse modulation; spectral analysers; AM-AM PA characterization; AM-PM PA characterization; PA behavior analysis; PA input amplitude; PA nonlinear static input-output relationship; PA output amplitude; PA output phase shift; RF laboratory; VSA measurement; continuous wave; distortion analysis; distortion generation; microwave laboratory; power amplifier; spectral magnitude; spectrum analyzer measurement; two-tone tests; vector signal analyzer; Laboratories; Lead; Microwave measurement; Microwave theory and techniques; Nonlinear distortion; Radio frequency; AM/AM; AM/PM; modeling; power amplifier; spectrum analyzer; two-tone test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multi-Conference on Systems, Signals & Devices (SSD), 2014 11th International
  • Conference_Location
    Barcelona
  • Type

    conf

  • DOI
    10.1109/SSD.2014.6808883
  • Filename
    6808883