DocumentCode :
1359713
Title :
Reflection Properties of Electromagnetic Wave in a Bounded Plasma Slab
Author :
Yuan, C.X. ; Zhou, Z.X. ; Sun, H.G.
Author_Institution :
Dept. of Phys., Harbin Inst. of Technol., Harbin, China
Volume :
38
Issue :
12
fYear :
2010
Firstpage :
3348
Lastpage :
3355
Abstract :
A bounded plasma stealth model is proposed in this paper. The method of impedance transformation with multiple dielectrics is used to study the propagation properties of electromagnetic (EM) waves in this plasma slab. The relations between the plasma parameters and the reflection which is a combination of the power reflected from the wall-plasma interface, the partial reflections from the bulk plasma, and the collisionally attenuated waves reflected by the conductive plane are derived. In addition, the reflections of the incident wave power dependence on the thickness of plasma are presented for different incident wave frequencies and various plasma parameters. The numerical calculation results show that, due to the presence of the walls, the mechanism of EM-wave attenuation is a combination of the collisional absorption and cavity resonance effects. It is demonstrated that detailed numerical analyses are useful in practical applications pertaining to the control of the reflection of EM waves through a uniform plasma slab covering the conductive plane.
Keywords :
electromagnetic wave reflection; plasma boundary layers; plasma dielectric properties; plasma electromagnetic wave propagation; plasma-wall interactions; EM-wave attenuation; bounded plasma slab; bounded plasma stealth model; cavity resonance; collision;]] absorption; collisionally attenuated waves; conductive plane; electromagnetic wave propagation; impedance transformation; multiple dielectrics; wall-plasma interface; Absorption; Attenuation; Electromagnetic scattering; Impedance; Plasmas; Reflection; Slabs; Electromagnetic (EM) wave; impedance; plasma; reflection;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2010.2084110
Filename :
5608512
Link To Document :
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