• DocumentCode
    1359725
  • Title

    Low-Temperature Processed Flexible In–Ga–Zn–O Thin-Film Transistors Exhibiting High Electrical Performance

  • Author

    Yang, Shinhyuk ; Bak, Jun Yong ; Yoon, Sung-Min ; Ryu, Min Ki ; Oh, Himchan ; Hwang, Chi-Sun ; Kim, Gi Heon ; Park, Sang-Hee Ko ; Jang, Jin

  • Author_Institution
    Oxide Electron. Team, Electron. & Telecommun. Res. Inst., Daejeon, South Korea
  • Volume
    32
  • Issue
    12
  • fYear
    2011
  • Firstpage
    1692
  • Lastpage
    1694
  • Abstract
    In-Ga-Zn-O thin-film transistors processed at 150°C on laminated polyethylene naphthalate substrates exhibit ing high electrical performances such as a saturation mobility of 24.26 cm2/(V · s), a subthreshold slope of 140 mV/dec, a turn-on voltage Von of -0.41 V, and an on-off ratio of 1.8 × 109 were fabricated. Cool-off-type adhesive was adopted to easily detach the plastic substrate from the carrier holder. Devices also showed highly uniform characteristics with a variation of 0.09 V in turn-on voltage. Stability characteristics under the positive gate bias stress can be enhanced by increasing the annealing time at 150°C.
  • Keywords
    II-VI semiconductors; flexible electronics; gallium compounds; indium compounds; organic compounds; thin film transistors; wide band gap semiconductors; zinc compounds; InGaZnO; carrier holder; cool-off-type adhesive; high electrical performance; laminated polyethylene naphthalate substrate; low-temperature processed flexible thin-film transistor; on-off ratio; plastic substrate; positive gate bias stress; saturation mobility; stability characteristics; temperature 150 degC; turn-on voltage; Annealing; Logic gates; Stress; Substrates; Temperature; Thermal stability; Transistors; Oxide; sputtering; thin-film transistor (TFT); transparent;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2011.2167122
  • Filename
    6059477