DocumentCode :
1359729
Title :
Complex current gain and cutoff frequency determination of HBTs
Author :
Zerounian, N. ; Aniel, F. ; Adde, R.
Author_Institution :
Inst. d´´Electron. Fondamentale, Univ. de Paris-Sud, Orsay, France
Volume :
36
Issue :
14
fYear :
2000
fDate :
7/6/2000 12:00:00 AM
Firstpage :
1236
Lastpage :
1237
Abstract :
The behaviour of the modulus and phase Φ(h2l) of the complex current gain h2l of high frequency heterojunction bipolar transistors (HBTs) has been investigated using an InGaAs/InAlAs/InP HBT, and compared with the behaviour predicted by a one pole/one zero analytical expression for h21 It is demonstrated that the phase value Φ(h2l)=-90° reliably locates the frequency range in which (h2l) frequency fall-off reaches -20 dB/dec, the criterion for determining fT. An analytical fit of the measured gain frequency product GF centred within this frequency range provides a reproducible and fully automated determination of fT
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; indium compounds; semiconductor device measurement; semiconductor device models; HBTs; InGaAs-InAlAs-InP; InGaAs/InAlAs/InP HBT; complex current gain; cutoff frequency; frequency fall-off; gain frequency product; high frequency heterojunction bipolar transistors; modulus; one pole/one zero analytical expression; phase;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20000875
Filename :
852263
Link To Document :
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