• DocumentCode
    1359942
  • Title

    Gaussian Jitter-Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting

  • Author

    Alegria, Francisco Corrêa ; Serra, António Cruz

  • Author_Institution
    Inst. de Telecomun., Tech. Univ. of Lisbon, Lisbon, Portugal
  • Volume
    59
  • Issue
    9
  • fYear
    2010
  • Firstpage
    2328
  • Lastpage
    2333
  • Abstract
    In this paper, the bias on the estimated amplitude, which is caused by Gaussian jitter, is studied in case of the IEEE 1057 standard three-parameter sine-fitting method. Because no analytical study exists, this source of uncertainty is usually not considered. Nowadays, it is becoming more and more important due to the ever increasing sampling rates available in analog-to-digital converters (ADCs), which are used in innumerable application like high-speed digital oscilloscopes. The effect of additive noise is also taken into account.
  • Keywords
    Gaussian processes; IEEE standards; amplitude estimation; analogue-digital conversion; jitter; ADC; Gaussian jitter-induced bias; IEEE 1057 standard; additive noise; analog-to-digital converters; high-speed digital oscilloscopes; sampling rates; sine wave amplitude estimation; three-parameter sine fitting method; Analog-to-digital converter (ADC); jitter; least squares fitting; noise; sine wave; sine wave fit; uncertainty;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2034576
  • Filename
    5356147