DocumentCode
1359942
Title
Gaussian Jitter-Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting
Author
Alegria, Francisco Corrêa ; Serra, António Cruz
Author_Institution
Inst. de Telecomun., Tech. Univ. of Lisbon, Lisbon, Portugal
Volume
59
Issue
9
fYear
2010
Firstpage
2328
Lastpage
2333
Abstract
In this paper, the bias on the estimated amplitude, which is caused by Gaussian jitter, is studied in case of the IEEE 1057 standard three-parameter sine-fitting method. Because no analytical study exists, this source of uncertainty is usually not considered. Nowadays, it is becoming more and more important due to the ever increasing sampling rates available in analog-to-digital converters (ADCs), which are used in innumerable application like high-speed digital oscilloscopes. The effect of additive noise is also taken into account.
Keywords
Gaussian processes; IEEE standards; amplitude estimation; analogue-digital conversion; jitter; ADC; Gaussian jitter-induced bias; IEEE 1057 standard; additive noise; analog-to-digital converters; high-speed digital oscilloscopes; sampling rates; sine wave amplitude estimation; three-parameter sine fitting method; Analog-to-digital converter (ADC); jitter; least squares fitting; noise; sine wave; sine wave fit; uncertainty;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2009.2034576
Filename
5356147
Link To Document