DocumentCode :
1359942
Title :
Gaussian Jitter-Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting
Author :
Alegria, Francisco Corrêa ; Serra, António Cruz
Author_Institution :
Inst. de Telecomun., Tech. Univ. of Lisbon, Lisbon, Portugal
Volume :
59
Issue :
9
fYear :
2010
Firstpage :
2328
Lastpage :
2333
Abstract :
In this paper, the bias on the estimated amplitude, which is caused by Gaussian jitter, is studied in case of the IEEE 1057 standard three-parameter sine-fitting method. Because no analytical study exists, this source of uncertainty is usually not considered. Nowadays, it is becoming more and more important due to the ever increasing sampling rates available in analog-to-digital converters (ADCs), which are used in innumerable application like high-speed digital oscilloscopes. The effect of additive noise is also taken into account.
Keywords :
Gaussian processes; IEEE standards; amplitude estimation; analogue-digital conversion; jitter; ADC; Gaussian jitter-induced bias; IEEE 1057 standard; additive noise; analog-to-digital converters; high-speed digital oscilloscopes; sampling rates; sine wave amplitude estimation; three-parameter sine fitting method; Analog-to-digital converter (ADC); jitter; least squares fitting; noise; sine wave; sine wave fit; uncertainty;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2009.2034576
Filename :
5356147
Link To Document :
بازگشت