• DocumentCode
    1360206
  • Title

    Solid state: X-ray lithography breaks the submicrometer barrier; A new X-ray lithography system allowed Bell Labs engineers to make the smallest, fastest MOSFETs yet reported

  • Author

    Lepselter, M.P.

  • Author_Institution
    Bell Labs., Holmdel, NJ, USA
  • Volume
    18
  • Issue
    5
  • fYear
    1981
  • fDate
    5/1/1981 12:00:00 AM
  • Firstpage
    26
  • Lastpage
    29
  • Abstract
    Describes an X-ray lithography system which allowed Bell Labs. engineers to make MOSFETs with channel lengths of 0.3 to 0.4 micrometers, switching speeds of 30 to 75 picoseconds, and speed-power products of 5 femtojoules (5×10-15 Ws) to 50 femtojoules. The X-ray system is smaller, less expensive, and more reliable than previous X-ray systems, and it also has a higher throughput-potentially 75 wafers per hour. It uses an exposure power of 4.5 kW, compared to the 20 to 40 kW in other systems. The key to a short exposure time with a low power source is the use of a novel resist that is more radiation-sensitive than conventional resists. Another advantage of the system is exceptional linewidth control-better than 0.1 micrometer across the wafer.
  • Keywords
    X-ray applications; field effect integrated circuits; integrated circuit technology; photolithography; photoresists; 0.3 to 0.4 micrometers; MOSFET; X-ray lithography system; field effect integrated circuit; linewidth control; Gallium arsenide; Laboratories; Logic gates; Plasmas; Polymers; Resists; Silicon;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1981.6369505
  • Filename
    6369505