• DocumentCode
    1360210
  • Title

    EMI reduction from airflow aperture arrays using dual-perforated screens and loss

  • Author

    Li, Min ; Nuebel, Joe ; Drewniak, James L. ; Hubing, Todd H. ; Dubroff, Richard E. ; Van Doren, Thomas P.

  • Author_Institution
    Missouri Univ., Rolla, MO, USA
  • Volume
    42
  • Issue
    2
  • fYear
    2000
  • fDate
    5/1/2000 12:00:00 AM
  • Firstpage
    135
  • Lastpage
    141
  • Abstract
    Airflow perforations in shielding enclosures can act as apertures facilitating the coupling from internal sources to external electromagnetic interference (EMI). This EMI radiation for single- and dual-screen configurations was studied herein experimentally and with finite-difference time domain (FDTD) modeling. A general EMI reduction of more than 20 dB was achieved for dual-perforated screens spaced 1 cm apart when compared to EMI for a single perforated screen. However, in the dual-screen case, the space between the screens can act as a thin cavity, which, in turn, can lead to significant radiation at distinct angles. Damping the resonances by loading the space between the screens with lossy material mitigates this problem and achieves more than 20-dB reduction over a single screen
  • Keywords
    absorbing media; electromagnetic coupling; electromagnetic interference; electromagnetic shielding; finite difference time-domain analysis; packaging; resonance; 1 cm; EM coupling; EMI radiation; EMI reduction; FDTD modeling; airflow aperture arrays; airflow perforations; dual-perforated screens; electromagnetic interference; finite-difference time domain; internal sources coupling; lossy material; resonance damping; shielding enclosures; single-screen configuration; thin cavity; Aluminum; Apertures; Damping; Electromagnetic coupling; Electromagnetic interference; Electromagnetic measurements; Finite difference methods; Resonance; Testing; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.852407
  • Filename
    852407